+@techreport{Nist10,
+ author = {Bassham,III, Lawrence E. and Rukhin, Andrew L. and Soto, Juan and Nechvatal, James R. and Smid, Miles E. and Barker, Elaine B. and Leigh, Stefan D. and Levenson, Mark and Vangel, Mark and Banks, David L. and Heckert, Nathanael Alan and Dray, James F. and Vo, San},
+ title = {SP 800-22 Rev. 1a. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications},
+ year = {2010},
+ institution = {National Institute of Standards \& Technology},
+ address = {Gaithersburg, MD, United States},
+}
+