+
+\subsection{Comparison with other well-known generators}
+
+\begin{table}
+\centering
+ \begin{tabular}{c|ccccccc}
+ PRNG & LCG & MRG & AWC & SWB & SWC & GFSR & INV\\
+ \hline
+ NIST & 11 & 14 & 15 & 15 & 14 & 14 & 14\\
+ DieHARD & 16 & 16 & 15 & 16 &18 & 16 & 16
+ \end{tabular}
+ \caption{Statistical evaluation of known PRNGs: number of succeeded tests}
+ \label{table:comparisonWithout}
+\end{table}
+
+\begin{table}
+\centering
+ \begin{tabular}{c|ccccccc}
+ PRNG & LCG & MRG & AWC & SWB & SWC & GFSR & INV\\
+ \hline
+ NIST & 15 & 15 & 15 & 15 & 15 & 15 & 15\\
+ DieHARD & 18 & 18 & 18 & 18 & 18 & 18 & 18
+ \end{tabular}
+ \caption{Statistical effects of CIPRNG on the succeeded tests}
+ \label{table:comparisonWith}
+\end{table}
+The objective of this section is to evaluate the statistical performance of the
+proposed CIPRNG method, by comparing the effects of its application on well-known
+but defective generators. We considered during the experiments the following PRNGs:
+linear congruential generator (LCG), multiple recursive generators (MRG)
+add-with-carry (AWC), subtract-with-borrow (SWB), shift-with-carry (SWC)
+Generalized Feedback Shift Register (GFSR), and nonlinear inversive generator.
+A general overview and a reminder of these generators
+can be found, for instance, in the documentation of the TestU01 statistical
+battery of tests~\cite{LEcuyerS07}. For each studied generator, we have compared
+their scores according to both NIST~\cite{Nist10} and DieHARD~\cite{Marsaglia1996}
+statistical batteries of tests, by launching them alone or inside the $\textit{CIPRNG}_f^2(v,v)$
+dynamical system, where $v$ is the considered PRNG set with most usual parameters,
+and $f$ is the vectorial negation.
+
+Obtained results are reproduced in Tables~\ref{table:comparisonWithout} and \ref{table:comparisonWith}.
+As can be seen, all these generators considered alone failed to pass either the 15 NIST tests or the
+18 DieHARD ones, while both batteries of tests are always passed when applying the $\textit{CIPRNG}_f^2$
+post-treatment. Other results in the same direction, which can be found in~\cite{bfgw11:ip}, illustrate
+the fact that operating a provable chaotic post-treatment on defective generators tends to improve
+their statistical profile.
+
+Such post-treatment depending on the properties of the inputted function $f$, we need to recall a general scheme to produce
+functions and an iteration number $b$ such that $\Gamma_{\{b\}}$ is strongly connected.