X-Git-Url: https://bilbo.iut-bm.univ-fcomte.fr/and/gitweb/dmems12.git/blobdiff_plain/5bd43a57b7e5c885d77aac6dceea8cc19f2cfaea..3db7a41271107989c56e4341465ecd92d7c3169b:/dmems12.tex?ds=inline

diff --git a/dmems12.tex b/dmems12.tex
index 423b0f7..a513137 100644
--- a/dmems12.tex
+++ b/dmems12.tex
@@ -71,6 +71,12 @@
 
 \section{Introduction}
 
+Cantilevers  are  used  inside  atomic  force  microscope  which  provides  high
+resolution images of  surfaces.  Several technics have been  used to measure the
+displacement  of cantilevers  in litterature.   For example,  it is  possible to
+determine  accurately   the  deflection  with   optic  interferometer~\cite{CantiOptic89},
+pizeoresistor~\cite{CantiPiezzo01}                 or                 capacitive
+sensing~\cite{CantiCapacitive03}.
 %% blabla +
 %% quelques ref commentées sur les calculs basés sur l'interférométrie