<html><head><meta name="color-scheme" content="light dark"></head><body><pre style="word-wrap: break-word; white-space: pre-wrap;">X-Git-Url: https://bilbo.iut-bm.univ-fcomte.fr/and/gitweb/dmems12.git/blobdiff_plain/bf7445b6734356ca388e58f07e1a1599c8a1df77..77fc759e3cccd43e2d9f6ee355069a0e80e5221f:/dmems12.tex?ds=inline

diff --git a/dmems12.tex b/dmems12.tex
index eb96b5e..d8d592d 100644
--- a/dmems12.tex
+++ b/dmems12.tex
@@ -71,7 +71,7 @@
 
 \section{Introduction}
 
-Cantilevers  are  used  inside  atomic  force  microscope  which  provides  high
+Cantilevers  are  used  inside  atomic  force  microscope (AFM) which  provides  high
 resolution images of  surfaces.  Several technics have been  used to measure the
 displacement  of cantilevers  in litterature.   For example,  it is  possible to
 determine  accurately  the  deflection  with different  mechanisms. 
@@ -90,7 +90,7 @@ fringes a  high speed camera  is used. Images  need to be processed  quickly and
 then  a estimation  method is  required to  determine the  displacement  of each
 cantilever.  In~\cite{AFMCSEM11},  the authors have  used an algorithm  based on
 spline to estimate the cantilevers' positions.
-%%RAPH : ce qui est gÃ©nant c'est qu'ils ne parlent pas de spline dans ce papier...
+
    The overall  process gives
 accurate results  but all the computation  are performed on  a standard computer
 using labview.  Consequently,  the main drawback of this  implementation is that
@@ -131,25 +131,33 @@ interferometry. In opposition to other optical based systems, using a laser beam
 deflection scheme and  sentitive to the angular displacement  of the cantilever,
 interferometry  is sensitive  to  the  optical path  difference  induced by  the
 vertical displacement of the cantilever.
-%%RAPH : est ce qu'on pique une image? gÃ©nant ou non?
+
 The system build  by authors of~\cite{AFMCSEM11} has been  developped based on a
-Linnick interferomter~\cite{Sinclair:05}.   A laser beam is first  split (by the
-splitter) into  a reference beam  and a sample  beam that reachs  the cantilever
-array.  In  order to be able  to move the cantilever  array, it is  mounted on a
-translation  and rotational  stage with  five  degrees of  freedom. The  optical
-system is also fixed to the stage. Thus, the cantilever array is centered in the
-optical system which can be adjusted accurately.  The beam illuminates the array
-by a  microscope objective and the  light reflects on  the cantilevers. Likewise
-the reference beam reflects on a movable mirror.  A CMOS camera chip records the
+Linnick     interferomter~\cite{Sinclair:05}.    It     is     illustrated    in
+Figure~\ref{fig:AFM}.  A  laser diode  is first split  (by the splitter)  into a
+reference beam and a sample beam  that reachs the cantilever array.  In order to
+be  able to  move  the cantilever  array, it  is  mounted on  a translation  and
+rotational hexapod  stage with  five degrees of  freedom. The optical  system is
+also fixed to the stage.  Thus,  the cantilever array is centered in the optical
+system which  can be adjusted accurately.   The beam illuminates the  array by a
+microscope objective  and the  light reflects on  the cantilevers.  Likewise the
+reference beam  reflects on a  movable mirror.  A  CMOS camera chip  records the
 reference and  sample beams which  are recombined in  the beam splitter  and the
-interferogram. At the beginning of each experiment, the movable mirror is fitted
-manually in order to align the interferometric fringes approximately parallel to
-the  cantilevers. When  cantilevers  move due  to  the surface,  the bending  of
-cantilevers produce movements in the fringes  that can be detected with the CMOS
-camera.  Finally  the fringes  need  to  be  analyzed. In~\cite{AFMCSEM11},  the
-authors used  a LabView program to  compute the cantilevers'  movements from the
-fringes.
-
+interferogram.   At the  beginning of  each  experiment, the  movable mirror  is
+fitted  manually in  order to  align the  interferometric  fringes approximately
+parallel  to the cantilevers.   When cantilevers  move due  to the  surface, the
+bending of  cantilevers produce  movements in the  fringes that can  be detected
+with    the    CMOS    camera.     Finally    the    fringes    need    to    be
+analyzed. In~\cite{AFMCSEM11}, the authors used a LabView program to compute the
+cantilevers' movements from the fringes.
+
+\begin{figure}    
+\begin{center}
+\includegraphics[width=\columnwidth]{AFM}
+\end{center}
+\caption{schema of the AFM}
+\label{fig:AFM}   
+\end{figure}
 
 
 %% image tirÃ©e des expÃ©riences.
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