ajout figure AFM

diff --git a/AFM.jpg b/AFM.jpg
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diff --git a/dmems12.tex b/dmems12.tex
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--- a/dmems12.tex
+++ b/dmems12.tex
@@ -71,7 +71,7 @@
 
 \section{Introduction}
 
 
 \section{Introduction}
 

-Cantilevers  are  used  inside  atomic  force  microscope  which  provides  high
+Cantilevers  are  used  inside  atomic  force  microscope (AFM) which  provides  high

 resolution images of  surfaces.  Several technics have been  used to measure the
 displacement  of cantilevers  in litterature.   For example,  it is  possible to
 determine  accurately  the  deflection  with different  mechanisms. 
 resolution images of  surfaces.  Several technics have been  used to measure the
 displacement  of cantilevers  in litterature.   For example,  it is  possible to
 determine  accurately  the  deflection  with different  mechanisms. 


@@ -90,7 +90,7 @@ fringes a  high speed camera  is used. Images  need to be processed  quickly and
 then  a estimation  method is  required to  determine the  displacement  of each
 cantilever.  In~\cite{AFMCSEM11},  the authors have  used an algorithm  based on
 spline to estimate the cantilevers' positions.
 then  a estimation  method is  required to  determine the  displacement  of each
 cantilever.  In~\cite{AFMCSEM11},  the authors have  used an algorithm  based on
 spline to estimate the cantilevers' positions.

-%%RAPH : ce qui est génant c'est qu'ils ne parlent pas de spline dans ce papier...
+

    The overall  process gives
 accurate results  but all the computation  are performed on  a standard computer
 using labview.  Consequently,  the main drawback of this  implementation is that
    The overall  process gives
 accurate results  but all the computation  are performed on  a standard computer
 using labview.  Consequently,  the main drawback of this  implementation is that


@@ -131,25 +131,32 @@ interferometry. In opposition to other optical based systems, using a laser beam
 deflection scheme and  sentitive to the angular displacement  of the cantilever,
 interferometry  is sensitive  to  the  optical path  difference  induced by  the
 vertical displacement of the cantilever.
 deflection scheme and  sentitive to the angular displacement  of the cantilever,
 interferometry  is sensitive  to  the  optical path  difference  induced by  the
 vertical displacement of the cantilever.

-%%RAPH : est ce qu'on pique une image? génant ou non?
-The system build  by authors of~\cite{AFMCSEM11} has been  developped based on a
-Linnick interferomter~\cite{Sinclair:05}.   A laser beam is first  split (by the
-splitter) into  a reference beam  and a sample  beam that reachs  the cantilever
-array.  In  order to be able  to move the cantilever  array, it is  mounted on a
-translation  and rotational  stage with  five  degrees of  freedom. The  optical
-system is also fixed to the stage. Thus, the cantilever array is centered in the
-optical system which can be adjusted accurately.  The beam illuminates the array
-by a  microscope objective and the  light reflects on  the cantilevers. Likewise
-the reference beam reflects on a movable mirror.  A CMOS camera chip records the
-reference and  sample beams which  are recombined in  the beam splitter  and the
-interferogram. At the beginning of each experiment, the movable mirror is fitted
-manually in order to align the interferometric fringes approximately parallel to
-the  cantilevers. When  cantilevers  move due  to  the surface,  the bending  of
-cantilevers produce movements in the fringes  that can be detected with the CMOS
-camera.  Finally  the fringes  need  to  be  analyzed. In~\cite{AFMCSEM11},  the
-authors used  a LabView program to  compute the cantilevers'  movements from the
-fringes.

 
 

+The system build  by authors of~\cite{AFMCSEM11} has been  developped based on a
+Linnick interferomter~\cite{Sinclair:05}. It is illustrated in Figure~\ref{fig:AFM}.  A
+laser beam is first  split (by the splitter) into a reference  beam and a sample
+beam  that reachs  the  cantilever  array.  In  order  to be  able  to move  the
+cantilever array, it is mounted on  a translation and rotational stage with five
+degrees of  freedom. The optical  system is also  fixed to the stage.  Thus, the
+cantilever  array  is centered  in  the optical  system  which  can be  adjusted
+accurately.  The  beam illuminates the array  by a microscope  objective and the
+light reflects  on the  cantilevers. Likewise the  reference beam reflects  on a
+movable mirror.  A CMOS camera chip records the reference and sample beams which
+are recombined in  the beam splitter and the interferogram.  At the beginning of
+each experiment,  the movable mirror  is fitted manually  in order to  align the
+interferometric  fringes   approximately  parallel  to   the  cantilevers.  When
+cantilevers  move  due  to  the  surface, the  bending  of  cantilevers  produce
+movements in the fringes that can be detected with the CMOS camera.  Finally the
+fringes need  to be  analyzed. In~\cite{AFMCSEM11}, the  authors used  a LabView
+program to compute the cantilevers' movements from the fringes.
+
+\begin{figure}    
+\begin{center}
+\includegraphics[width=\columnwidth]{AFM}
+\end{center}
+\caption{schema of the AFM}
+\label{fig:AFM}   
+\end{figure}

 
 
 %% image tirée des expériences.
 
 
 %% image tirée des expériences.