From: couturie Date: Sat, 15 Oct 2011 18:41:34 +0000 (+0200) Subject: ajout biblio X-Git-Url: https://bilbo.iut-bm.univ-fcomte.fr/and/gitweb/dmems12.git/commitdiff_plain/3db7a41271107989c56e4341465ecd92d7c3169b ajout biblio --- diff --git a/biblio.bib b/biblio.bib new file mode 100644 index 0000000..c392b6d --- /dev/null +++ b/biblio.bib @@ -0,0 +1,39 @@ + + + +@Article{CantiCapacitive03, + author = {D. R. Baselt and B. Fruhberger and E. Klaassen and S. Cemalovic and C. L. Britton and S. V. Patel and T. E. Mlsna and D. McCorkle and B. Warmack}, + title = {Design and performance of a microcantilever-based hydrogen sensor}, + journal = {Sensors and Actuators B: Chemical}, + year = {2003}, + volume = {88}, + number = {2}, + pages = {120--131}, + month = {Jan}, +} + + + + +@Article{CantiPiezzo01, + author = {N. Abedinov and P. Grabiec and T. Gotszalk and T. Ivanov and J. Voigt and I. W. Rangelow}, + title = {Micromachined piezoresistive cantilever array with integrated resistive microheater for calorimetry and mass detection}, + journal = {Journal of Vacuum Science and Technology A}, + year = {2001}, + volume = {19}, + number = {6}, + pages = {2884–2888}, + month = {Nov}, +} + + +@Article{CantiOptic89, + author = {D. Rugar and H. J. Mamin and P. Guethner}, + title = {Improved fiber-optic interferometer for atomic force microscopy}, + journal = {Appl. Phys. Lett.}, + year = {1989}, + volume = {55}, + number = {25}, + pages = {2588--2590}, + +} diff --git a/dmems12.tex b/dmems12.tex index 423b0f7..a513137 100644 --- a/dmems12.tex +++ b/dmems12.tex @@ -71,6 +71,12 @@ \section{Introduction} +Cantilevers are used inside atomic force microscope which provides high +resolution images of surfaces. Several technics have been used to measure the +displacement of cantilevers in litterature. For example, it is possible to +determine accurately the deflection with optic interferometer~\cite{CantiOptic89}, +pizeoresistor~\cite{CantiPiezzo01} or capacitive +sensing~\cite{CantiCapacitive03}. %% blabla + %% quelques ref commentées sur les calculs basés sur l'interférométrie