From: Pierre-Cyrille Heam Date: Wed, 26 Sep 2012 07:33:25 +0000 (+0200) Subject: pch : modif ds l'intro un d'une ref dans reponse X-Git-Url: https://bilbo.iut-bm.univ-fcomte.fr/and/gitweb/prng_gpu.git/commitdiff_plain/725505ba2683a3f4a5a00955d99b175d2a141d69 pch : modif ds l'intro un d'une ref dans reponse --- diff --git a/prng_gpu.tex b/prng_gpu.tex index f357476..bc06797 100644 --- a/prng_gpu.tex +++ b/prng_gpu.tex @@ -180,8 +180,8 @@ Pseudorandom numbers are generated at a rate of 20GSamples/s, which is faster than in~\cite{conf/fpga/ThomasHL09,Marsaglia2003} (and with a better statistical behavior). Experiments are also provided using BBS as the initial random generator. The generation speed is significantly weaker. -Note also that an original qualitative comparison between topological chaotic -properties and statistical test is also proposed. +%Note also that an original qualitative comparison between topological chaotic +%properties and statistical test is also proposed. diff --git a/reponse.tex b/reponse.tex index dbe927a..a0d3da6 100644 --- a/reponse.tex +++ b/reponse.tex @@ -47,7 +47,7 @@ Done. \bigskip \textit{There seems to have been no effort in showing how the new PRNG improves on a single (say) xorshift generator, considering the slowdown of calling 3 of them per iteration (cf. Listing 1). This could be done, if not with the mathematical rigor of chaos theory, then with simpler bit diffusion metrics, often used in cryptography to evaluate building blocks of ciphers.} -A large section (Section 5) has been added, using and extending some previous works. It explains with more details why topological chaos +A large section (Section 2 of the Annex document) has been provided, using and extending some previous works. It explains with more details why topological chaos is useful to pass statistical tests. This new section contains both qualitative explanations and quantitative (experimental) evaluations. Using several examples, this section illustrates that defective PRNGs are always improved, according to the NIST, DieHARD, and TestU01 batteries.