un peu plus d'intro

diff --git a/biblio.bib b/biblio.bib
index c392b6dc889286e63be6025c9cd95adac9a49f76..5eb51eab27b32405fafe015631eb47c74f74b570 100644 (file)
--- a/biblio.bib
+++ b/biblio.bib
@@ -37,3 +37,15 @@
        pages =                  {2588--2590},
 
 }
+
+
+@Article{AFMCSEM11,
+       author =                         {M. Favre and J. Polesel-Maris and T. Overstolz and P. Niedermann and S. Dasen and G. Gruener and R. Ischer and P. Vettiger and M. Liley and H. Heinzelmann and A. Meister},
+       title =                          {Parallel AFM imaging and force spectroscopy using two-dimensional probe arrays for applications in cell biology},
+       journal =                {Journal of Molecular Recognition},
+       year =                           {2011},
+       volume =         {24},
+       number =         {3},
+       pages =                  {446–452},
+}
+

diff --git a/dmems12.tex b/dmems12.tex
index a51313754361ffae82edc743e810be54fcb52a3e..6a7f646d5180266faf81ff73cade38332b7afc8e 100644 (file)
--- a/dmems12.tex
+++ b/dmems12.tex
@@ -74,10 +74,32 @@
 Cantilevers  are  used  inside  atomic  force  microscope  which  provides  high
 resolution images of  surfaces.  Several technics have been  used to measure the
 displacement  of cantilevers  in litterature.   For example,  it is  possible to
-determine  accurately   the  deflection  with   optic  interferometer~\cite{CantiOptic89},
-pizeoresistor~\cite{CantiPiezzo01}                 or                 capacitive
-sensing~\cite{CantiCapacitive03}.
-%% blabla +
+determine        accurately        the        deflection       with        optic
+interferometer~\cite{CantiOptic89},     pizeoresistor~\cite{CantiPiezzo01}    or
+capacitive  sensing~\cite{CantiCapacitive03}.  In  this paper  our  attention is
+focused   on  a  method   based  on   interferometry  to   measure  cantilevers'
+displacements.   In  this  method   cantilevers  are  illiminated  by  an  optic
+source. The interferometry produces fringes on each cantilevers which enables to
+compute the  cantilever displacement.   In order to  analyze the fringes  a high
+speed camera is used. Images need  to be processed quickly and then a estimation
+method  is   required  to  determine   the  displacement  of   each  cantilever.
+In~\cite{AFMCSEM11} {\bf verifier ref}, the authors have used an algorithm based
+on spline  to estimate  the cantilevers' positions.   The overall  process gives
+accurate results  but all the computation  are performed on  a standard computer
+using labview.  Consequently,  the main drawback of this  implementation is that
+the computer is a bootleneck in the overall process. In this paper we propose to
+use a  method based on least  square and to  implement all the computation  on a
+FGPA.
+
+The remainder  of the paper  is organized as  follows. Section~\ref{sec:measure}
+describes  more precisely  the measurement  process. Our  solution based  on the
+least  square   method  and   the  implementation  on   FPGA  is   presented  in
+Section~\ref{sec:solus}.       Experimentations      are       described      in
+Section~\ref{sec:results}.  Finally  a  conclusion  and  some  perspectives  are
+presented.
+
+
+
 %% quelques ref commentées sur les calculs basés sur l'interférométrie
 
 \section{Measurement principles}
@@ -334,9 +356,9 @@ Finally, the whole summarizes in an algorithm (called LSQ in the following) in t
 
 \subsubsection{Comparison}
 
-\subsection{VDHL design paradigms}
+\subsection{VHDL design paradigms}
 
-\subsection{VDHL implementation}
+\subsection{VHDL implementation}
 
 \section{Experimental results}
 \label{sec:results}